ZEISS Applies Artificial Intelligence to 3D X-ray Microscope Reconstruction Technologies

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Two new reconstruction technologies introduced today by ZEISS use Artificial Intelligence (AI) to improve data collection and analysis, and speed up decision-making significantly. Now available for the Advanced Reconstruction Toolkit (ART) on ZEISS Xradia 3D X-ray platforms, ZEISS DeepRecon Pro and ZEISS PhaseEvolve modules increase throughput by up to 10x while producing better than ever image quality. They’re designed for research fields including geosciences, pharmaceuticals, electronics, battery and engineering materials as well as for semiconductor failure analysis.

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